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We offer a full line of instruments that connect to your XP- or Vista-based computer, as well as optional accessories that fill your measurement needs. |
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Low-Cost Application-Specific Instruments
| F10-AR |
Measures reflectance of ophthalmic lenses and other curved surfaces. Options available for measuring hardcoat thickness and transmittance.
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| F10-HC |
Measures hardcoat and anti-fog layer thicknesses and index. Popular in automotive and other industries that hardcoat polycarbonate.
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| F10-PA |
Provides hands-free measurement of parylene thickness.
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| F10-VC |
Measures reflectance and transmittance simultaneously. Options available for measuring thickness and index. Popular in vacuum coating applications.
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General-Purpose Instruments with
Full-Analysis Capabilities
| F20 |
Used in thousands of applications worldwide. Available with a wide range of accessories and wavelength coverage.
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| F20-XT |
Optimized for thicker films - up to 0.5mm in some cases.
Popular in Si-thinning applications. |
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On-Line Monitoring Instruments
| F30 |
Monitors reflectance, thickness, and deposition rates during MOCVD, sputtering, and other deposition processes.
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| F37 |
In-line thin-film measuring instrument with up to seven probe locations supported. |
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Microscope-Based Instruments
| F40 |
Attaches to your microscope to measure of thickness and index in spots as small as 2.5 um.
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| F42 |
Complete 2-D thickness micro-mapping system. |
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Automated Mapping of Unpatterned Surfaces
| F50 |
Adds automated mapping capabilities to our F20 family of products. Thickness and index can be mapped as fast as two points per second.
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F50-XY-
450 |
Used for mapping when samples are larger than 300mm in diameter.
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| F60-t |
Production-ready tabletop mapping system includes on-board reference, notch finding, interlocked cover, and more.
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Automated Mapping of Patterned Semiconductors
| F80-t |
Production-ready tabletop patterned-wafer mapping system capable of 15-points in 21 seconds.
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| F80-c |
Cassette-to-cassette version of the F80-t. Supports up to 300mm wafers.
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| F80-a |
Automated wafer mapping with integrated wafer transfer tool. Supports up to 300mm wafers.
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