|
Material: All at-least-partially-transparent films, plus all semiconductors (transparent or not.) The film must be at least somewhat shiny in appearance.
Thickness range: We can measure thicknesses from 3nm to 500um. Refractive index can be measured for films 70nm to 10um thick.
Number of layers: Usually we can measure up to three individual films in a film stack. In some circumstances we can measure dozens of layers.
Substrate material: If the film is on a rough substrate (which includes most metals), generally the film’s refractive index cannot be measured. In addition, rough substrates limit the minimum measurable film thickness to about 50nm.
Required information: We must know the ordering, identity, and nominal thickness of all films present, whether they are to be measured or not.
Contact our thin-film experts to discuss your measurement needs.
Filmetrics offers Free Trial Measurements - results are typically available in 1-2 days. |
|
